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Bayesian Optimization Framework for Improved Cross-Version Defect Prediction
Jeongwhan Choi, Duksan Ryu KIPS Transactions on Software and Data Engineering,
Vol. 10, No. 9, pp. 339-348,
Sep.
2021
https://doi.org/10.3745/KTSDE.2021.10.9.339
Keywords: Software Defect Prediction, Bayesian Optimization, Transfer Learning, Cross-Version Defect Prediction
https://doi.org/10.3745/KTSDE.2021.10.9.339
Keywords: Software Defect Prediction, Bayesian Optimization, Transfer Learning, Cross-Version Defect Prediction
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